Evolution of the phase structure, magnetic domain structure, and magnetic properties of annealed Fe72Ga28 thin films

Hello colleagues that doing product photography

I have 4 geared tripods to choose from, some with 42cm minimal height, others 82mm minimal height, is that important to go as low as 42cm(~16 inch) or as high as 2 meters?

1. Manfrotto 028B

3. Manfrotto 058B

4. Manfrotto 161MK2B

Is that geared center column is useful as compared to regular tripod? Is it stable enough?

Thanks for your input

What products are you photographing?

Just a suggestion that having a tripod which can extend our to the side so you can shoot with the camera facing straight down can sometimes be helpful (depending on the products you photograph).

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Maxim Dupliy wrote:

I have two Manfroto tripods, although not those models.  Quality is pretty high.

I find the geared versions very useful, but it’s still necessary to recognize that raising the center column can reduce stability.

–Personal, non commercial vacation snapshots athttps://www.castle-explorers.com

Any tabletop/product photography in studio

Even with geared column raised it reduces stability? Are you sure?

Do you have any case where this stability was an issue? Does the center column can change slightly it’s position between the shots if you are not touching the center geared column?

Which model do you have?

For product work, in general greater height is more useful.

Anytime you make anything higher without widening it’s base it reduces it’s stability.

No, I don’t raise it all the way.

Mine have a lock on them.

What version of geared tripod do you have?

A tripod with the center column raised the more it becomes monopod-like

You have misunderstanding of my question. I know all the info you try to explain me. It’s obvious things every beginner knows. I ask you what tripod model you are using?

Abstract

In contrast to the disordered body-centered cubic (bcc) A2 phase, the ordered face-centered cubic (fcc) L12 phase exhibits negative magnetostriction (λ) and has a high elastic modulus (E). Therefore, an in-depth understanding of the microstructural evolution of Fe–Ga thin films from bcc A2 phase to fcc L12 phase is essential to obtain Fe–Ga thin films with desirable properties. The transformation of the phase structure, magnetic domain structure, and magnetic properties of Fe72Ga28 thin films is analyzed in this study. The phase transformation of the Fe72Ga28 thin film from A2 to A2 L12 occurred after heat treatment, as determined by high-resolution transmission electron microscopy (HRTEM) and glancing-incidence X-ray diffraction (GI-XRD). Non-continuous lattice distortion at the phase boundaries of A2 and L12 was also observed, as shown by geometric phase analysis (GPA) and electron backscattered scattering detection (EBSD). Numerous edge dislocations at the phase boundaries were revealed by HRTEM. A shift in the magnetic domain structure from the maze-like domain to maze-like domain and honeycomb-like domain was detected by magnetic force microscopy (MFM). The variation in magnetic properties was determined to be related to the structural transformation and ununiform lattice distortion between the phase boundaries of the A2 and L12.

Introduction

In this work, magnetostrictive Fe72Ga28 thin films were prepared by direct current (DC) magnetron sputtering with heat treatment at 730 °C for 3 h and furnace cooling. Detailed spherical aberration-corrected high-resolution transmission electron microscopy (HRTEM) was employed to investigate annealed Fe72Ga28 thin films. Microstructural analysis reveals numerous edge dislocations and discontinuous lattice distortion at the boundaries of the A2 + L12 phases. The magnetic domain structure changes from maze-like domain to maze-like domain and honeycomb-like domain. In addition, the effects of structural transformation and lattice distortion on the magnetic properties of the studied films were also analyzed.

Section snippets

Fe72Ga28 alloy consisting of high-purity Fe (99.9 wt%) and Ga (99.9 wt%) was prepared by induction melting in an argon (Ar) atmosphere. The target was cut from the ingot, with a diameter of 76.2 mm and a thickness of 2 mm. The Fe72Ga28 thin films (270 nm) with Ti (100 nm) buffer layers were deposited on 40 mm × 5 mm × 0.5 mm Si (100) substrates by DC magnetron sputtering (Discovery 635). Before sputtering, the target and Si were successively cleaned with deionized water, alcohol, and acetone

Morphology

EDS spectroscopy showed that the Fe and Ga elements were evenly distributed with an atomic ratio of 72:28. Fig. 1 shows the cross-sectional SEM image of the Fe72Ga28 thin film. The result suggests that the Fe72Ga28 thin film, Ti buffer layer, and Si substrate are well bonded to each other. In addition, the thicknesses of the Fe72Ga28 thin films and the Ti buffer layer are about 270 nm and 100 nm, respectively.

Fig. 2 shows the surface morphology (scan size: 10 × 10 µm2) and tridimensional

Conclusion

The morphology, microstructure, phase transition, magnetic domain structure, and magnetic properties of Fe72Ga28 thin films prepared by DC magnetron sputtering were systematically investigated. GI–XRD and HRTEM analyses indicate the occurrence of a phase transformation from A2 to A2 + L12 in the film annealed at 730 °C for 3 h and then cooled in a furnace. Microstructural analysis shows the presence of numerous edge dislocations and discontinuous lattice distortions at the boundaries of the

Hongyu Yi: Conceptualization, Formal analysis, Validation, Writing – original draft, Writing – review & editing. Jiheng Li: Conceptualization, Writing – original draft, Writing – review & editing. Haijun Yu: Validation, Resources. Fan Li: Visualization, Resources. Xiaoqian Bao: Conceptualization, Writing – original draft, Writing – review & editing. Xuexu Gao: Supervision.

Declaration of Competing Interest

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Acknowledgments

This study was financially supported by the National Natural Science Foundation of China (Grant No. ), the State Key Laboratory for Advanced Metals and Materials (, ), and the Fundamental Research Funds for the Central Universities (, , ).

• Out of plane component of the magnetization of sputtered Fe72Ga28 layersJ. Magn. Magn. Mater.
• et al.Magnetic-domain-wall pinning by regions of weak exchange or anisotropyPhys. Lett. A
• et al.Ordering and magnetostriction in Fe alloy single crystalsProg. Cryst. Growth Charact. Mater.
• et al.Magnetoelastic damping in Fe–Ga solid-solution alloysMater. Sci. Eng. A
• et al.Influence of composition and heat treatment on damping and magnetostrictive properties of Fe–18%(Ga+Al) alloys
• et al.Magnetic domain observations in Fe–Ga alloysJ. Magn. Magn. Mater.
• Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures
• et al.Comparative study of structure and phase transitions in Fe-(25–27)%Ga alloysJ. Alloy. Compd.
• et al.Internal structure evolution of L12 variants in aged Fe-Ga alloysJ. Alloy. Compd.
• et al.Effect of high magnetic field on the phase transition in Fe-24%Ga and Fe-27%Ga during isothermal annealingJ. Magn. Magn. Mater.

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